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Total 329건
4 페이지
게시판 검색
2018
239
J.I. Yoo, H.S. Jang, J.W.Jang, J.W.Yoon, Y.K. Oh, J.J. Park, S.M. Kang, T.J. Yoo, S.H. Kim, B.H. Lee, S.H. Choa and H.C.Ko,
"Reliable peripheral anchor-assisted transfer printing of ultrathin SiO2 for transparent and flexible IGZO-based inverter"
Microelectronic Engineering
,
197,
pp.15-22,
2018.05.18.
https://doi.org/10.1016/j.mee.2018.05.003.
238
W.J.Park, S.F.Shaikh, J.W.Min, S.K.Lee, B.H.Lee, M.M. Hussain,
"Contact Resistance Reduction of ZnO Thin Film Transistors (TFTs) with Saw-Shaped Electrode"
Nanotechnology
,
29,
p.325202,
2018.06.05.
https://doi.org/10.1088/1361-6528/aac4b9.
237
K.E. Chang, T.J. Yoo, C.H. Kim, Y.J. Kim, S.K. Lee, S.Y. Kim, S.W.Heo, M.G. Kwon, B.H. Lee,
"Gate controlled graphene-silicon Schottky junction photodetector"
Small
,
14(28),
p.1801182,
2018.06.07.
https://doi.org/10.1002/smll.201801182.
236
S. Seo, H. Choi, S.Y. Kim, J. Lee, K. Kim, S. Yoon, B.H. Lee, S. Lee,
"Growth of centimeter-scale monolayer and Few-layer WSe2 thin films on SiO2/Si substrates via pulsed laser deposition"
Advanced Materials Interfaces
,
5(20),
p.1800524,
2018.06.12.
https://doi.org/10.1002/admi.201800524.
235
J.S. Song, M.J. Seo, T.H. Lee, Y.R. Jo, J.M. Lee, T.M. Kim, S.-Y. Kim, S.M. Kim, S.Y. Jeong, H.J. An, S.K. Kim, B.H. Lee, D.H. Lee, H.W. Jang, B.J. Kim, S.H. Lee,
"Tailoring crystallographic orientations to substantially enhance charge separation efficiency in anisotropic BiVO4 photoanodes"
ACS Catalysis
,
8(7),
p.5952,
2018.05.22.
https://doi.org/10.1021/acscatal.8b00877.
234
F. Ahmed, S.W. Heo, Y.Z. Zheng, F. Ali, C.H. Ra, H.I. Lee, T. Taniguchi, J. Hone, B.H. Lee, W.J. Yoo,
"Dielectric dispersion and high field response of multilayer hexagonal boron nitride"
Advanced Functional Materials
,
28(40),
1804235,
2018.08.10.
https://doi.org/10.1002/adfm.201804235.
233
S.W.Heo, H.I.Lee, H.J. Lee, S.M. Kim, K.Y. Kim, Y.J. Kim, S.Y.Kim, J.H.Kim, M.H. Yoon, B.H.Lee,
"Very low-temperature integrated complementary graphene barristor based inverter for thin film transistor applications"
Annalen der Physik
,
530(10),
p.1800224,
2018.09.20.
https://doi.org/10.1002/andp.201800224.
232
S.W. Heo, S.M. Kim, K.Y. Kim, H.J. Lee, S.Y. Kim, Y.J. Kim, S.M. Kim, H.I. Lee, S.G. Lee, K.R. Kim, S.H. Kang, B.H. Lee,
"Ternary Full Adder Using Multi-Threshold Voltage Graphene Barristors"
IEEE Electron Device Letters
,
39(12),
p.1948,
2018.10.05.
http://doi.org/10.1109/LED.2018.2874055.
231
S.K .Lim, S.C. Kang, T.J. Yoo, S.K. Lee, B.H. Lee,
"Operation mechanism of MoS2/BP hetero junction FET"
Nanomaterials
,
8(10),
p.797,
2018.09.20.
https://doi.org/10.3390/nano8100797.
230
H.J. Hwang, Y.S. Lee, C. Cho, B.H. Lee,
"Facile process to clean PMMA residue on graphene using KrF laser annealing"
AIP Advances
,
8(10),
p.105326,
2018.08.25.
https://doi.org/10.1063/1.5051671.
229
S. Lai, S.J. Byeon, S.K. Jang, J.H. Lee, B.H. Lee, J.H. Park, Y.H. Kim, S.J. Lee,
"HfO2/HfS2 hybrid heterostructure fabricated via controllable chemical conversion of two-dimensional HfS2"
Nanoscale
,
10,
p.18758-18766,
2018.06.26.
http://doi.org/10.1039/c8nr06020g.
2017
228
Y.J. Kim, W.J. Park, J.H. Yang, Y.H. Kim, B.H. Lee,
"Contact Resistance Reduction of WS2 FETs Using High-Pressure Hydrogen Annealing"
IEEE Journal of the Electron Devices Society
,
6,
164-168,
2017.12.08.
http://doi.org/10.1109/JEDS.2017.2781250.
227
M.W. Son, Y. Park, S.S. Chee, F.M. Auxilia, K.H. Kim, B.K. Lee, S.G. Lee, S.K. Kang, C.D. Lee, J.S. Lee, K.K. Kim, Y.H. Jang, B.H. Lee, G.Y. Jung, M.H. Ham,
"Charge transfer in graphene/polymer interfaces for CO2 detection"
Nano Research
,
11 (7),
3529-3536,
2018.08.02.
http://doi.org/10.1007/s12274-017-1857-z.
226
Y.H. Kim, A.R. Kim, G. Zhao, S.Y. Choi, S.C. Kang, S.K. Lim, K.E. Lee, J.C. Park, B.H. Lee, M.G. Hahm, D.H. Kim, J.J. Yun, K.H. Lee, B.J. Cho,
"Wafer-Scale Integration of Highly Uniform and Scalable MoS2 Transistors"
ACS Applied Materials & Interfaces
,
9 (42),
37146-37153,
2017.10.25.
http://doi.org/10.1021/acsami.7b10676.
225
J.S. Song, M.G. Lee, H.W. Heong, S.H. Seo, J.A. Yoo, T.L. Kim, J.M. Lee, H.S. No, D.H. Kim, S.Y. Heong, H.J. An, B.H. Lee, C.W. Bark, H.W. Park, H.W. Jang, S.H. Lee,
"Template-engineered epitaxial BiVO4 photoanodes for efficient solar water splitting"
Journal of Materials Chemistry A
,
5 (35),
18831-18838,
2017.08.14.
http://doi.org/10.1039/C7TA04695B.
224
C. Cho, S.K. Lee, T.J. Yoo, S.W. Heo, H.J. Hwang, C.G. Kang, M.H. Ham, B.H. Lee,
"Pulsed KrF laser-assisted direct deposition of graphitic capping layer for Cu interconnect"
Carbon
,
123,
307-310,
2017.10.
http://doi.org/10.1016/j.carbon.2017.07.075.
223
S.S. Chee, C.H. Oh, M.W. Son, G.C. Son, H.B. Jang, T.J. Yoo, S.M. Lee, W.K. Lee, J.Y. Hwang, H.Y. Choi, B.H. Lee, M.H. Ham,
"Sulfur vacancy-induced reversible doping of transition metal disulfides via hydrazine treatment"
Nanoscale
,
9 (27),
9333-9339,
2017.04.20.
http://doi.org/10.1039/C7NR01883E.
222
J. Jia, J. Xu, J.H. Park, B.H. Lee, E.H. Hwang, S.J. Lee,
"Multifunctional Homogeneous Lateral Black Phosphorus Junction Devices"
Chemistry of Materials
,
29 (7),
3143-3151,
2017.04.11.
http://doi.org/10.1021/acs.chemmater.7b00210.
221
J. Noh, S.M. Kim, S. Heo, S.C. Kang, Y.G. Lee, H.K. Park, S.K. Lee, B.H. Lee,
"Time Domain Reflectometry Analysis of the Dispersion of Metal–Insulator–Metal Capacitance"
IEEE Electron Device Letters
,
38 (4),
521-524,
2017.04.
http://doi.org/10.1109/LED.2017.2671367.
220
H.J. Hwang, K.E. Chang, W.B. Yoo, C.H. Shim, S.K. Lee, J.H. Yang, S.Y. Kim, Y.S. Lee, C. Cho, B.H. Lee,
"A graphene barristor using nitrogen profile controlled ZnO Schottky contacts"
Nanoscale
,
9 (7),
2442-2448,
2017.01.23.
http://doi.org/10.1039/C6NR08829E.
2016
219
Y.J. Kim, S.Y. Kim, J. Noh, C.H. Shim, U.J. Jung, S.K. Lee, K.E. Chang, C. Cho, B.H. Lee*,
"Demonstration of Complimentary Ternary Graphene Field Effect Transistors"
Scientific Reports
,
6,
p.39393,
2016.12.19.
https://doi.org/10.1038/srep39353.
218
Y. Kumaresan, Y.S. Pak, N.S. Lim, Y.H. Kim, M.J. Park, S.M. Yoon, H.M. Youn, H. Lee, B.H. Lee, G.Y. Jung,
"Highly Bendable In-Ga-ZnO Thin Film Transistors by Using a Thermally Stable Organic Dielectric Layer"
Scientific Reports
,
6,
37764,
2016.11.23.
https://doi.org/10.1038/srep37764.
217
N. Fujisawa, T.F. Zhang, B.H.Lee, K.H.Kim,
"A robust method for extracting the mechanical properties of thin films with rough surfaces by nanoindentation"
J. of Materials Research
,
31(23),
p.3777-3785,
2016.12.14.
https://doi.org/10.1557/jmr.2016.428.
216
A.K. Khan, B.,H.Lee*,
"Monolayer MoS2 metal insulator transition based memcapacitor modeling with extension to a ternary device"
AIP Advances
,
6,
p.096022,
2016.09.23.
https://doi.org/10.1063/1.4963776.
215
Y.H. Kim, A.R. Kim, J.H. Yang, K.E. Chang, J. Kwon, S. Y. Choi, K. H. Lee, B.H. Lee, M.G. Hahm, and B. Cho,
"Alloyed 2D Metal-Semiconductor Heterojunctions: Origin of Interface States Reduction and Schottky Barrier Lowering"
Nano Letters
,
16(9),
p.5928-5933,
2016.08.23.
https://doi.org/10.1021/acs.nanolett.6b02893.
214
B.J.Co, A.R.Kim, D.J.Kim, H.S.Chung,S.Y.Choi, J.D. Kwon, S.W.Park, Y.H.Kim, B.H.Lee, K.H.Lee, D.H.Kim, J.W.Nam, M.G.Hahm,
"Two-Dimensional Atomic-Layered Alloy Junctions for High-Performance Wearable Chemical Sensor"
ACS Applied Materials and Interfaces
,
8,
p.19635-19632,
2016.07.07.
https://doi.org/10.1021/acsami.6b05943.
213
Y.H.Kim, W.J.Park, J.H. Yang, C Cho, S.K.Lee, B.H.Lee*,
"Reduction of Low Frequency Noise at Multilayer MoS2 FETs using a Fermi Level De-pinning Layer"
Physica Status Solidi-RRL
,
10(8),
p.634-638,
2016.06.29.
https://doi.org/10.1002/pssr.201600136.
212
J.W. Yoon, Y.K. Jeong, H.J. Kim, S.G. Yoo, Y.H. Kim , Y.K. Hwang, Y.J. Hyun, W.K. Hong, B.H.Lee, S.H. Choa, H.C. Ko,
"Robust stretchable indium gallium Zinc oxide-based electronic textiles formed by cilia-assisted transfer printing"
Nature communications
,
7,
p.11477,
2016.06.01.
https://doi.org/10.1038/ncomms11477.
211
Y.G.Lee, S.K.Lim, C.G.Kang, Y.J.Kim, D.H.Choi, H.J.Chung, R.Choi, B.H.Lee*,
"Origin of the channel width dependent field effect mobility of graphene field effect transistors"
Microelectronic Engineering
,
163,
p.55-59,
2016.06.06.
https://doi.org/10.1016/j.mee.2016.06.004.
210
Y.H.Kim, S.C.Kang, S.K.Lee, U.J.Jung, S.M. Kim, B.H.Lee*,
"Hot carrier instability of nMOSFETs under Pseudo Random Bit Sequence stress"
IEEE Electron Device Letters
,
37(4),
p.366-368,
2016.03.01.
https://doi.org/10.1109/LED.2016.2533568.
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