PBTI-Associated High Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High-k Dielectrics
- Journal
- IEEE Electron Device Letters
- Vol
- 29 (4)
- Page
- p.389-391
- Year
- 2008
- File
- 2008_EDL_KTLEE.pdf (400.4K) 0회 다운로드 DATE : 2021-04-01 14:38:49
- Link
- http://doi.org/10.1109/LED.2008.918257 240회 연결