포항공대 EESL Fearless challenge

An Accurate Capacitance-Voltage Measurement Method for Highly leaky Devices-Part II

Journal

IEEE Transactions on Electron Devices

Vol

55 (9)

Page

p.2437-2442

Author

Y. Wang, K.P. Cheung, R. Choi, B.H.Lee

Year

2008

Date

2008.08.19

doi

http://doi.org/10.1109/TED.2008.927659

File

2008_TOED_YWANG.pdf (576.7K) 0회 다운로드 DATE : 2021-04-01 14:59:08

Link

http://doi.org/10.1109/TED.2008.927659 206회 연결