포항공대 EESL Fearless challenge

An Accurate Capacitance-Voltage Measurement Method for Highly Leaky Devices-Part I

Journal

IEEE Transactions on Electron Devices

Vol

55 (9)

Page

p.2429-2436

Author

Y. Wang, K.P. Cheung, R. Choi, B.H.Lee

Year

2008

Date

2008.08.08

doi

http://doi.org/10.1109/TED.2008.928489

File

2008_TOED_YWANG1.pdf (464.9K) 0회 다운로드 DATE : 2021-04-01 15:00:40

Link

http://doi.org/10.1109/TED.2008.928489 166회 연결