An Accurate Capacitance-Voltage Measurement Method for Highly Leaky Devices-Part I
- Journal
- IEEE Transactions on Electron Devices
- Vol
- 55 (9)
- Page
- p.2429-2436
- Year
- 2008
- File
- 2008_TOED_YWANG1.pdf (464.9K) 0회 다운로드 DATE : 2021-04-01 15:00:40
- Link
- http://doi.org/10.1109/TED.2008.928489 165회 연결