Ultra-Short Pulse Current-Voltage Characterization of the Intrinsic Characteristics of High-κ Devices
- Journal
- Japanese Journal of Applied Physics
- Vol
- 44 (4B)
- Page
- 2437-2440
- Year
- 2005
- File
- 2005_JJAP_CDYOUNG.pdf (362.6K) 0회 다운로드 DATE : 2021-04-01 16:12:04
- Link
- http://iopscience.iop.org/1347-4065/44/4S/2437 146회 연결