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    • Validity of Constant Voltage Stress Based Reliability Assessment of High-k Devices
    Journal
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
    Vol
    5 (1)
    Page
    20
    Author
    B.H. Lee, R. Choi, J. Sim, S. Krishnan, J. Peterson, G.A. Brown and G.Bersuker
    Year
    2005
    Date
    2005.06.13(invited)
    doi
    https://doi.org/10.1109/TDMR.2005.845807
    File
    2005_TDMR_BHLEE.pdf (489.6K) 0회 다운로드 DATE : 2021-04-01 16:25:04