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    • Quantitative analysis of interfacial reactions at a graphene/SiO2 interface using the discharge current analysis method
    Journal
    Appl. Phys. Lett.
    Vol
    104
    Page
    151604
    Author
    U. Jung, Y.G. Lee, C.G. Kang, S.C Lee, B.H. Lee*
    Year
    2014
    Date
    2014.04.17
    doi
    https://doi.org/10.1063/1.4871866
    File
    2014_APL_UJJUNG.pdf (625.8K) 2회 다운로드 DATE : 2021-04-01 16:37:54