포항공대 EESL Fearless challenge

Quantitatively estimating defects in graphene devices using discharge current analysis method

Journal

Scientific Reports

Vol

4

Page

4886

Author

U.Jung, Y.G.Lee, C.G.Kang, S.C.Lee, J.J.Kim, H.J.Hwang, S.K.Lim, M.H.Ham, B.H.Lee*

Year

2014

Date

2014.05.08

doi

https://doi.org/10.1038/srep04886

File

2014_SREP_UJJung.pdf (802.5K) 1회 다운로드 DATE : 2021-04-01 16:43:30

Link

https://doi.org/10.1038/srep04886 131회 연결