포항공대 EESL Fearless challenge

Electrical Observation of Deep Traps in High-k/Metal Gate Stack Transistors

Journal

IEEE ELECTRON DEVICE LETTERS

Vol

26 (11)

Page

839

Author

H. R. Harris, R. Choi, J.H. Sim, C. Young, P. Majhi, B. H. Lee, G. Bersuker

Year

2005

Date

2005.10.24

doi

https://doi.org/10.1109/LED.2005.857727

File

2005_EDL_H.R.Harris.pdf (120.6K) 0회 다운로드 DATE : 2021-04-01 16:47:25

Link

https://doi.org/10.1109/LED.2005.857727 150회 연결