목록 게시판 리스트 옵션 검색 Direct defect level analysis for Metal-Insulator-Metal Capacitor using Internal Photoemission Spectroscopy Journal IEEE J. of EDS Vol 9 Page 9404305 Author T.J.Yoo, H.J.Hwang, S.C.Kang, S.W.Heo, H.I.Lee, Y.G.Lee, H.K.Park, S.K.Lee and B.H. Lee* Year 2021 Date 2021 File 2021 JEDS TJYoo.pdf (1.6M) 4회 다운로드 DATE : 2022-06-01 16:21:40
