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Extraction of the Interface State Density of Top-Gate Graphene Field-Effect Transistors

Journal

IEEE Electron Device Letters

Vol

36 (4)

Page

408-410

Author

U.Jung, Y.J.Kim, Y.H.Kim, Y.G.Lee, and B.H.Lee

Year

2015

Date

2015.02.10

doi

https://doi.org/10.1109/LED.2015.2402287

File

2015-EDL-UJung.pdf (808.3K) 1회 다운로드 DATE : 2021-04-01 20:49:33

Link

https://doi.org/10.1109/LED.2015.2402287 178회 연결