포항공대 EESL Fearless challenge

Characterization and Reliability Measurement Issues in Novel Gate Stack Devices

Journal

Thin Solid Films

Vol

504

Page

223

Author

R. Choi, C.D. Young, G. Bersuker, Y.Zhao, B. H. Lee

Year

2006

Date

2006.02.28

doi

https://doi.org/10.1016/j.tsf.2005.09.178

File

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Link

https://doi.org/10.1016/j.tsf.2005.09.178 159회 연결