Feasibility Study of Mo/SiOx/Pt Resistive Random Access Memory in an Inverter Circuit for FPGA Applications
Journal
IEEE Elect. Dev. Lett.
Vol
32(12)
Page
P.1665
Author
S.S. Park, J.H. Shin, S. Cimino, S.J. Jung, J.M. Lee, S.H. Kim, J.B. Park, W.T. Lee, M.W. Son, B.H. Lee, L. Pantisano and H. Hwang
Year
2011
Date
2011.10.20
doi
https://doi.org/10.1109/LED.2011.2168376
File
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