Evaluation of titanium silicon nitride as gate electrodes for complimentary metal-oxide semicondiuctor
- Journal
- Appl. Phys. Lett.
- Vol
- 88(14)
- Page
- 142113
- Year
- 2006
- File
- 2006_APL_H.Luan.pdf (305.3K) 0회 다운로드 DATE : 2021-04-01 21:36:27
- Link
- https://doi.org/10.1063/1.2188380 186회 연결