포항공대 EESL Fearless challenge

Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs

Journal

Microelectronics Engioneering

Vol

88

Page

3399-3403

Author

H.M. Kwon, W.H. Choi, I.S. Han, M.K. Na, S.U. Park, J.D. Bok, C.Y. Kang, B.H. Lee, R. Jammy, H.D. Lee

Year

2011

Date

2011.12

doi

https://doi.org/10.1016/j.mee.2010.04.002

File

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Link

https://doi.org/10.1016/j.mee.2010.04.002 190회 연결