포항공대 EESL Fearless challenge

Decoupling of cold carrier effects in hot carrier reliability assessment of HfO2 gated nMOSFETs

Journal

IEEE Elec. Dev. Lett.

Vol

27(8)

Page

662

Author

H.K. Park, R. Choi, B. H. Lee, S.C. Song, M. Chang, C.D. Young , G. Bersuker, J.C. Lee and H. Hwang

Year

2006

Date

2006.07.24

doi

10.1109/LED.2006.878041

File

2006_EDL_H.K.Park.pdf (107.7K) 0회 다운로드 DATE : 2021-04-01 21:51:27

Link

http://10.1109/LED.2006.878041 74회 연결