목록 Negative oxygen vacancies in HfO2 as charge traps in high-k stacks Journal Appl. Phys. Lett. Vol 89(8) Page 082908 Author J.L.Gavartin, D.Munz Ramo, A.L.Shluger, G.Bersuker, B. H. Lee Year 2006 Date 2006.08.24 doi https://doi.org/10.1063/1.2236466 File 2006_APL_JLGAVARTIN.pdf (392.6K) 0회 다운로드 DATE : 2021-04-01 21:58:30 Link https://doi.org/10.1063/1.2236466 256회 연결
