NMOS Compatible Work Function of TaN Metal Gate With Gadolinium Oxide Buffer Layer on Hf-Based Dielectrics
Journal
IEEE Elec. Dev. Lett.
Vol
27(10)
Page
802
Author
G. Thareja, S. Rhee, H.-C. Wen, R. Harris, P. Majhi, B. H. Lee and J.C. Lee
Year
2006
Date
2006.09.25
doi
10.1109/LED.2006.882521
File
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