On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-k Dielectrics
Journal
IEEE Elec. Dev. Lett.
Vol
27(12)
Page
984-987
Author
H.-C. Wen, H. R. Harris, C.D. Young, H.Luan, H.N. Alshareef, K. Choi, D.-L. Kwong, P. Majhi, G. Bersuker, and B. H. Lee
Year
2006
Date
2006.11.30
doi
10.1109/LED.2006.886711
File
2006_EDL_HCWEN.pdf (399.8K) 0회 다운로드 DATE : 2021-04-01 22:10:07