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    • On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-k Dielectrics
    Journal
    IEEE Elec. Dev. Lett.
    Vol
    27(12)
    Page
    984-987
    Author
    H.-C. Wen, H. R. Harris, C.D. Young, H.Luan, H.N. Alshareef, K. Choi, D.-L. Kwong, P. Majhi, G. Bersuker, and B. H. Lee
    Year
    2006
    Date
    2006.11.30
    doi
    10.1109/LED.2006.886711
    File
    2006_EDL_HCWEN.pdf (399.8K) 0회 다운로드 DATE : 2021-04-01 22:10:07