포항공대 EESL Fearless challenge

Temperature dependence of the work function of ruthenium-based gate electrodes

Journal

Thin Solid Films

Vol

515(4)

Page

1294-1298

Author

H.N. Alshareef, H.C.Wen, H.F. Luan, K. Choi, H.R. Harris, Y. Senzaki, P. Majhi, B. H. Lee, B.Foran, G. Lian

Year

2006

Date

2006.12

doi

https://doi.org/10.1016/j.tsf.2006.03.026

File

2006_TSF_HNALSHAREEF.pdf (259.2K) 0회 다운로드 DATE : 2021-04-02 13:47:32

Link

https://doi.org/10.1016/j.tsf.2006.03.026 136회 연결