포항공대 EESL Fearless challenge

New Hot-Carrier Injection Mechanism at Source Side in Nanoscale Floating-Body MOSFETs

Journal

IEEE Electron Device Letters

Vol

30 (1)

Page

54-56

Author

J.-W. Yang, H.R. Harris, G. Bersuker, C.Y. Kang, J. Oh, B.H. Lee, H.-H. Tseng, R. Jammy

Year

2009

Date

2009.01

doi

http://doi.org/10.1109/LED.2008.2007661

File

2009_EDL_JWYANG.pdf (425.1K) 1회 다운로드 DATE : 2021-04-02 17:08:51

Link

http://doi.org/10.1109/LED.2008.2007661 183회 연결