포항공대 EESL Fearless challenge

Pulsed Id-Vg Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling

Journal

IEEE Transactions on Electron Devices

Vol

56 (6)

Page

1322-1329

Author

C.D. Young, G. Bersuker, R. Choi, D. Heh, B.H. Lee, Y. Zhao

Year

2009

Date

2009.05.20

doi

http://doi.org/10.1109/TED.2009.2019384

File

2009_EDL_CDYOUNG.pdf (783.2K) 0회 다운로드 DATE : 2021-04-02 17:19:42

Link

http://doi.org/10.1109/TED.2009.2019384 188회 연결