포항공대 EESL Fearless challenge

A Study of Strain Engineering Using CESL Stressor on Reliability Comparing Effect of Intrinsic Mechanical Stress

Journal

IEEE Electron Device Letters

Vol

30 (7)

Page

760-762

Author

K.T. Lee, C.Y. Kang, M.S. Park, B.H. Lee, H.K. Park, H. Hwang, H.H. Tseng, R. Jammy, Y.H. Jeong

Year

2009

Date

2009.05.27

doi

http://doi.org/10.1109/LED.2009.2021007

File

2009_EDL_KTLEE.pdf (423.1K) 0회 다운로드 DATE : 2021-04-02 17:22:28

Link

http://doi.org/10.1109/LED.2009.2021007 157회 연결