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Time Domain Reflectometry Analysis of the Dispersion of Metal–Insulator–Metal Capacitance

Journal

IEEE Electron Device Letters

Vol

38 (4)

Page

521-524

Author

J. Noh, S.M. Kim, S. Heo, S.C. Kang, Y.G. Lee, H.K. Park, S.K. Lee, B.H. Lee

Year

2017

Date

2017.04

doi

http://doi.org/10.1109/LED.2017.2671367

File

2017-EDL-JWNoh.pdf (798.0K) 3회 다운로드 DATE : 2021-04-02 17:56:40

Link

http://doi.org/10.1109/LED.2017.2671367 207회 연결