Performance Evaluation of Scaled ZnO Stacked Nanosheet Channel Ternary Field Effect Transistor
Journal
IEEE Electron Device Letters
Vol
43(2)
Page
pp.323-326
Author
H.I. Lee, S.Y. Kim, S.M. Kim, Y.S. Lee, H.W. Lee, S.H. Yu, H.J. Hwang, M.M. Sung, B.H.Lee*
Year
2022
Date
2022
doi
10.1109/LED.2021.3139225
File
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