포항공대 EESL EESL Fearless challenge

전체메뉴

전체메뉴
CONTACT US
  • LOGIN
    • Chemically induced Fermi Level Pinning Effects of High-k Dielectrics on Graphene
    Journal
    Scientific Reports
    Vol
    8(1)
    Page
    pp.2992
    Author
    S.Y.Kim, Y.J.Kim, U.Jung, B.H.Lee
    Year
    2018
    Date
    2018.02.14
    doi
    https://doi.org/10.1038/s41598-018-21055-z
    File
    2018-SR-SYKim.pdf (2.4M) 1회 다운로드 DATE : 2021-03-31 15:14:36