목록 게시판 리스트 옵션 검색 Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors Journal Nanomaterials Vol 10(6) Page 1186 Author S.C. Kang, H.W. Jung, S.J. Chang, S.M. Kim, S.K. Lee, B.H.Lee, H.C. Kim, Y.S. Noh, S.H. Lee, S.I. Kim, H.K. Ahn, J.W. Lim Year 2020 Date 2020.06.18 doi https://doi.org/10.3390/nano10061186 File nanomaterials-10-01186.pdf (2.4M) 4회 다운로드 DATE : 2021-03-31 17:42:25 Link https://doi.org/10.3390/nano10061186 99회 연결