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Time Domain Reflectometry for capacitance-voltage measurement with very high leakage current

Journal

IEEE Electron Device Letters

Vol

28 (1)

Page

p.51-53

Author

Y. Wang, K. P. Cheung, R. Choi, G. A. Brown, B. H. Lee

Year

2007

Date

2006.12.26

doi

http://doi.org/10.1109/LED.2006.887628

File

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Link

http://doi.org/10.1109/LED.2006.887628 163회 연결