포항공대 EESL Fearless challenge

Electrical characterization and analysis technique for high-k era

Journal

Microelectronics Reliability

Vol

47

Page

p.479-488

Author

C.D.Young, D. Heh, A. Neugroschel, R.Choi, B.H.Lee, G.Bersuker

Year

2007

Date

2007.04.09

doi

http://doi.org/10.1016/j.microrel.2007.01.053

File

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Link

http://doi.org/10.1016/j.microrel.2007.01.053 175회 연결