Electrical characterization and analysis technique for high-k era
- Journal
- Microelectronics Reliability
- Vol
- 47
- Page
- p.479-488
- Year
- 2007
- File
- 2007_MR_CDYOUNG.pdf (534.4K) 0회 다운로드 DATE : 2021-04-01 13:39:35
- Link
- http://doi.org/10.1016/j.microrel.2007.01.053 176회 연결