Error and correction in capacitance-voltage measurement due to the presence of source and drain
Journal
IEEE Electron Device Letters
Vol
28 (7)
Page
p. 640-642
Author
Y. Wang, K. P. Cheung, R. Choi, G. A. Brown, B. H. Lee
Year
2007
Date
2007.06.25
doi
http://doi.org/10.1109/LED.2007.899602
File
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