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    • Electric-field-driven dielectric breakdown of metal-insulator-metal hafnium silicate
    Journal
    Appl. Phys. Lett.
    Vol
    91
    Page
    243514
    Author
    B. H. Lee, C.Y.Kang, S. Krishnan, P.Kirsch, D. Heh, C. Young, J.W. Yang, G. Bersuker, R.Choi, H.D.Lee
    Year
    2007
    Date
    2007.12.14
    doi
    http://doi.org/10.1063/1.2825288
    File
    2007_APL_BHLEE.pdf (446.1K) 0회 다운로드 DATE : 2021-04-01 14:04:49