포항공대 EESL Fearless challenge

Decoupling the Fermi level pinning effect and intrinsic limitations on p-type effective work function metal electrodes

Journal

Microelectronic Engineering

Vol

85

Page

p.2-8

Author

H.C. Wen, P. Majhi, K.Choi, C.S.Park, H.Alshareef, H.Rusty, H.Luan, H.Niimi, H.B.Park, G.Bersuker, P.Lysaght, D.L.Kwong, S.C.Song, B. H. Lee and R. Jammy

Year

2008

Date

2008.05.16

doi

http://doi.org/10.1016/j.mee.2007.05.006

File

2008_ME_HCWEN.pdf (568.3K) 0회 다운로드 DATE : 2021-04-01 14:48:01

Link

http://doi.org/10.1016/j.mee.2007.05.006 108회 연결