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2 페이지
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2015
3
Domestic
"FinFET의 AC Stress Reliability 특성"
강수철, 이영곤, 김용훈, 정욱진, 박우진, 김윤지, 이병훈,
22nd Korean Conference on Semiconductors(KCS),
2015.
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2
Domestic
"TDR 분석법을 이용한 미세전계효과소자의 Effective Moliblity 추출 방법"
김용훈, 정욱진, 강수철, 이영곤, 이병훈,
22nd Korean Conference on Semiconductors(KCS),
2015.
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1
Domestic
"Top gate graphene FET의 Fermi level과 계면결함 밀도의 상관관계 연구"
정욱진, 김윤지, 김용훈, 김소영, 이병훈,
22nd Korean Conference on Semiconductors(KCS),
2015, Best poster award..
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