포항공대 EESL Fearless challenge

Effect of high pressure annealing on the reliability of FDSOI tunneling FET

Conference

Int. Conf. on Solid State Device and Materials (SSDM)

Author

Soo Cheol Kang, Donghwan Lim, Sung Kwan Lim, Jinwoo Noh, Seung-Mo Kim, Sang Kyung Lee, Changhwan Choi, and Byoung Hun Lee

Year

2017

Date

2017

학회구분

International

File

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