목록 Contact Resistance Reduction for MoS2 FETs with Insulating Layers Conference 44th IEEE Semiconductor Interface Specilaists Conference (SISC) Author W.J.Park, Y.H.Kim, S.K.Lee, U.Jung, J.H.Yang, C.Cho, Y.J.Kim, S.K.Lim, and B.H.Lee Year 2014 Date 2014 학회구분 International File 2014_SISC_WJPARK.pdf (279.9K) 0회 다운로드 DATE : 2021-04-02 15:08:50
