포항공대 EESL Fearless challenge

Impacts of series resistance at top-gate graphene FET

Conference

Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE)

Author

Sunwoo Heo, Sang Kyung Lee, Yun Ji Kim, Byoung Hun Lee

Year

2016

Date

2016

학회구분

International

File

2016_ENGE_SWHEO.pdf (700.7K) 0회 다운로드 DATE : 2021-04-04 13:37:23