목록 게시판 리스트 옵션 검색 Pure physical defects formation using AFM lithography on graphene channel Conference NANO KOREA Author Seung-Mo Kim, Yongsu Lee, Sunwoo Heo, Ho-In Lee, Min Gyu Kwon, Hyeon Jun Hwang, and Byoung Hun Lee Year 2019 Date 2019 학회구분 International File 2019_Nano-korea_김승모.pdf (1.7M) 0회 다운로드 DATE : 2021-04-04 13:56:37
