포항공대 EESL Fearless challenge

Enhanced Heavy-Ion Radiation Hardness in ZnO Thin-Film Transistors via Crystal Structure Engineering

Conference

IEEE International Reliability Physics Symposium (IRPS)

Author

Y.S. Lee, H.W. Lee, S.J. Kim, J.M. Park, B.H. Lee, C.G. Kang

Year

2026

Date

2026

학회구분

International