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1997
2

G. Cha, B. H. Lee, K. W. Lee, G. J. Bae, W. D. Kim, J. H. Lee, I. K. Kim, K. C. Park, S. I. Lee and Y. B. Koh, "Design Considerations for Patterned Wafer Bonding" Japanese Journal of Applied Physics, 36, 1912, 1997.05.
1

J. M. Leng, J. J. Sidorowich, Y. D. Yoon, J. Opsal, B. H. Lee, "Simultaneous measurement of six layers in a silicon on insulator film stack using spectrophotometry and beam profile reflectometry" Journal of Applied Physics, 81 (8), 3570, 1997.04.15. https://doi.org/10.1063/1.364994.

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