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PBTI-Associated High Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High-k Dielectrics

Journal

IEEE Electron Device Letters

Vol

29 (4)

Page

p.389-391

Author

K.T.Lee, C.Y.Kang, O.S.Yoo, R.Choi, B.H.Lee, J.C.Lee, H.D.Lee and Y.H.Yoon

Year

2008

Date

2008.03.21

doi

http://doi.org/10.1109/LED.2008.918257

File

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Link

http://doi.org/10.1109/LED.2008.918257 230회 연결