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    • Transient Charging and Relaxation in High-k Gate Dielectric and Their Implications
    Journal
    Japanese Journal of Applied Physics
    Vol
    44 (4B)
    Page
    2415-2419
    Author
    B.H. Lee, C. Young, R. Choi, J.H. Sim, G. Bersuker and G. Brown
    Year
    2005
    Date
    2005.04.21
    doi
    https://doi.org/10.1143/JJAP.44.2415
    File
    2005_JJAP_BHLEE.pdf (109.9K) 0회 다운로드 DATE : 2021-04-01 16:09:40