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    • Ultra-Short Pulse Current-Voltage Characterization of the Intrinsic Characteristics of High-κ Devices
    Journal
    Japanese Journal of Applied Physics
    Vol
    44 (4B)
    Page
    2437-2440
    Author
    C.D. Young, Y. Zhao, M. Pendley, B. H. Lee, K. Matthews, J.H. Sim, R. Choi, G.A. Brown, R.W. Murto and G. Bersuker
    Year
    2005
    Date
    2005.04.21
    doi
    http://iopscience.iop.org/1347-4065/44/4S/2437
    File
    2005_JJAP_CDYOUNG.pdf (362.6K) 0회 다운로드 DATE : 2021-04-01 16:12:04