Validity of Constant Voltage Stress Based Reliability Assessment of High-k Devices
- Journal
- IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
- Vol
- 5 (1)
- Page
- 20
- Year
- 2005
- File
- 2005_TDMR_BHLEE.pdf (489.6K) 0회 다운로드 DATE : 2021-04-01 16:25:04
- Link
- https://doi.org/10.1109/TDMR.2005.845807 255회 연결