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“Mobility evaluation in transistors with charge-trapping gate dielectrics

Journal

APPLIED PHYSICS LETTERS

Vol

87

Page

042905

Author

G. Bersuker, P. Zeitzoff, J. Sim, B. H. Lee, R. Choi, G. Brown, C. Young

Year

2005

Date

2005.07.22

doi

https://doi.org/10.1063/1.1995956

File

2005_APL_G.Bersuker.pdf (351.6K) 1회 다운로드 DATE : 2021-04-01 16:30:44

Link

https://doi.org/10.1063/1.1995956 113회 연결