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Intrinsic mobility evaluation of high-k gate dielectric transistors using pulse Id-Vg

Journal

IEEE ELECTRON DEVICE LETTERS

Vol

26 (8)

Page

586

Author

C.D. Young, P. Zeitzoff, G.A. Brown, G.Bersuker, B. H. Lee, and J.R. Hauser

Year

2005

Date

2005.07.18

doi

https://doi.org/10.1109/LED.2005.852746

File

2005_EDL_C.D.Young.pdf (241.6K) 0회 다운로드 DATE : 2021-04-01 16:34:12

Link

https://doi.org/10.1109/LED.2005.852746 184회 연결