Electrical Observation of Deep Traps in High-k/Metal Gate Stack Transistors
- Journal
- IEEE ELECTRON DEVICE LETTERS
- Vol
- 26 (11)
- Page
- 839
- Year
- 2005
- File
- 2005_EDL_H.R.Harris.pdf (120.6K) 0회 다운로드 DATE : 2021-04-01 16:47:25
- Link
- https://doi.org/10.1109/LED.2005.857727 156회 연결