Extraction of the Interface State Density of Top-Gate Graphene Field-Effect Transistors
Journal
IEEE Electron Device Letters
Vol
36 (4)
Page
408-410
Author
U.Jung, Y.J.Kim, Y.H.Kim, Y.G.Lee, and B.H.Lee
Year
2015
Date
2015.02.10
doi
https://doi.org/10.1109/LED.2015.2402287
File
2015-EDL-UJung.pdf (808.3K) 0회 다운로드 DATE : 2021-04-01 20:49:33