The Pulsed Id-Vg methodology and Its Application to the Electron Trapping Characterization of High-κ gate Dielectrics
- Journal
- J. Semi. Tech. Sci.
- Vol
- 10(2)
- Page
- 79-99
- Year
- 2010
- File
- 2010_JSTS_CDYoung.pdf (1.1M) 0회 다운로드 DATE : 2021-04-02 13:53:42
- Link
- https://doi.org/10.5573/JSTS.2010.10.2.079 199회 연결